PC100 Specification

PC100 Long Term Aging & Micro-Jump Test Station
The micro-jump and aging test station is designed to test quartz crystals, XO, TCXO, VCXO, and low powered OCXO devices in individually temperature-controlled cavities. Long-term frequency aging and micro jumps are independently measured on each unit. The test instrument is used in a laboratory or in a production environment. Crystals and oscillators with aging rates of 5 X 10E-11 per day and micro jumps of 1 X 10E-9 (Opt 03), aging rates of 1 x 10E-11 and micro-jumps of 2.5 X 10E-10 (Opt 31) can be accurately measured. The Standard Instrument consists of a control rack with power supplies, frequency counter, a 20 cavity test rack, and a computer/printer with a software package. The system is expandable to 100 cavities without modification.

PC100 OPT 03 LONG TERM AGING AND MICRO-JUMP SYSTEM SPECIFICATION

Download PC100_Opt_03_Micro-Jump_Spec_.pdf

PC100 OPT 31 LONG TERM AGING AND MICRO-JUMP SYSTEM SPECIFICATION

Download PC100_Opt_31_Micro-Jump_Spec_.pdf