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Measuring Short Term Micro-Jumps With the PC400
The PC400 Phase Noise Test Rack and a Time Interval Analyzer can be configured to measure short term micro-jumps. The output signal from the oscillator or crystal under test is measured by the analyzer and the jitter distribution plot is generated by the analyzer’s internal software.
SHORT TERM MICRO-JUMP APPLICATION NOTE
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|Oscillator Parameter Testing|
|Crystal Parameter Testing|
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